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TSOP封装老化测试座
SOP封装贴片测试座
QFP封装老化测试座
QFP封装贴片测试座
QFN(MLF)封装老化测试座
BGA封装老化测试座
BGA封装贴片测试座
CSP封装老化测试座
SOT / TO封装老化测试座
PLCC封装老化测试座
DIP封装老化测试座
SOJ封装老化测试座
PGA封装老化测试座

 

 

 

 

 


首页芯片测试插座,连接器产品测试座

菱美电子专业代理及经销各式IC测试座,IC测试夹具,老化测试座,电源模块测试座,品牌包括:ENPLAS,YAMAICHI,
WELLS-CTI,E-TEC,3M TEXTOOL,TI,PLASTRONICS,ADVANCED INTERCONNECTIONS 球型出脚BGA测试插座,
MERITEC贴片SOP测试插座等.测试座封装含概:BGA,,CSP,PGA,QFN,MLF,LGA,QFP,TSOP,SOP,PLCC,SOJ,TO等
并且可以根据客户需求定制BGA/QFN测试座.无论您是设计,测试,烧录,还是老化,生产,必有一款满足您的要求.



 

BGA Socket  /  BGA测试座/老化座/烧写座
LGA Socket / LGA测试座/ CGA Socket/CGA测试座

菱美电子提供最全的BGA/LGA/CGA测试/老化插座产品,依托欧洲领先的BGA测试产品生产工艺,为客户提供优质的BGA/CSP/LGA测试插座产品,并可根据客户芯片的规格,提供定制化的服务.BGA测试插座分球形出脚(SMT)和针形出脚两种设计.球形出脚的BGA插座系统主要适用于芯片的测试及开发等.该插座系统的特点是不用在PCB板上开孔,BGA插座的焊接方法和BGA芯片的焊接方法完全一样.同时如果在客户的目标板上BGA Pad旁边如果已经存在一些贴片器件而影响到BGA插座的安装,我们亦提供BGA插座的升高设计以便满足客户的实际要求.部分BGA插座货期更短至2-3周。并可根据客户的BGA器件出脚,定制合适的BGA插座(Available for any chip size and grid pattern)。     

老化插座的工作温度一般为:-55°C~150 °C    

More Info..

  IC Test and Burn-In Socket - LingMei Electronic

 

BGA Surface Mount Socket(表贴,球形出脚)
Solderless Compression Type(无需焊接的BGA测试插座

  • Any package style: ceramic & plastic BGA, CSP, LGA, CGA, PSGA, MLF/QFN,QFP, SOIC, and other standard packages, custom packages or bare die

  • Same footprint as BGA device.

  • -1dB bandwidth: >14GHz for compression style; 3GHz for SMD style

  • Inductance: less than 2nH

  • Hundreds of footprints available from 1.5mm down to 0.50mm pitch.

More Info..

  IC Test and Burn-In Socket - LingMei Electronic

 

 

QFN Socket \ MLF socket

  • Available in .40, .50, .65, .80 and 1.00 mm pitches

  • Custom pitches down to .30 mm

  • Lidded and Open Top Sockets for 3 mm - 10 mm packages

  • Hundreds of footprints available from 1.5mm down to 0.75mm pitch.

  • Lidded Sockets for 10 - 16 mm packages

  • Center ground pin standard for all sockets

  • Optional copper heat slug available for high wattage devices

  • Sockets for over 80 different JEDEC standard footprints

More Info..

  IC Test and Burn-In Socket - LingMei Electronic

PGA Socket / PGA测试老化测试座

菱美电子提供最全的PGA测试/老化插座,产品分为2.54mm及1.27mm两重规格,品牌包括:3M™ Textool™ ,WELLS-CTI,Advanced Interconnections及YAMAICHI等.

 

More Info..

 IC Test and Burn-In Socket - LingMei Electronic

 

QFP Socket / QFP老化测试座

  • Pin counts 32 to 304  

  • Pitch sizes 0.4, 0.5, 0.635, 0.65, 0.8 and 1.0mm

  • High reliability, durability and temperature range

  • Custom made also available for high pin count and fine

More Info..

 IC Test and Burn-In Socket - LingMei Electronic

 

SOP Socket / SOP老化测试座

Pin Count:16 to 88

Pitch:0.5 to 1.27

More Info..

 IC Test and Burn-In Socket - LingMei Electronic

 

TSOP Socket / TSOP老化测试座

 

More Info..

 IC Test and Burn-In Socket - LingMei Electronic

 

SOP Surface Mount Socket

980020-48-01,980020-48-02

More Info..

 IC Test and Burn-In Socket - LingMei Electronic

 

DIP Socket / DIP老化座

 

More Info..

 IC Test and Burn-In Socket - LingMei Electronic
 

SOJ  Socket / SOJ老化测试座

 

 

IC Test and Burn-In Socket - LingMei Electronic

PLCC Socket / PLCC老化测试座

 

More Info..

 

IC Test and Burn-In Socket - LingMei Electronic

SOT Socket/晶体管测试座/电源模块测试座

 

 

More Info..

IC Test and Burn-In Socket - LingMei Electronic

TO Socket / TO老化座

 

IC Test and Burn-In Socket - LingMei Electronic

 

 

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